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a microchip technology company ?2011 silicon storage technology, inc. s71417-03-000 02/11 data sheet www.microchip.com www.sst.com features: ? single voltage read and write operations ? 2.7-3.6v ? serial interface architecture ? spi compatible: mode 0 and mode 3 ? high speed clock frequency ?upto80mhz ? superior reliability ? endurance: 100,000 cycles (typical) ? greater than 100 years data retention ? low power consumption: ? active read current: 10 ma (typical) ? standby current: 5 a (typical) ? flexible erase capability ? uniform 4 kbyte sectors ? uniform 32 kbyte overlay blocks ? uniform 64 kbyte overlay blocks ? fast erase and byte-program: ? chip-erase time: 35 ms (typical) ? sector-/block-erase time: 18 ms (typical) ? byte-program time: 7 s (typical) ? auto address increment (aai) programming ? decrease total chip programming time over byte-pro- gram operations ? end-of-write detection ? software polling the busy bit in status register ? busy status readout on so pin in aai mode ? hold pin (hold#) ? suspends a serial sequence to the memory without deselecting the device ? write protection (wp#) ? enables/disables the lock-down function of the status register ? software write protection ? write protection through block-protection bits in status register ? temperature range ? commercial: 0c to +70c ? industrial: -40c to +85c ? packages available ? 8-lead soic (150 mils) ? 8-contact wson (6mm x 5mm) ? all non-pb (lead-free) devices are rohs compliant 2 mbit spi serial flash SST25VF020B the 25 series serial flash family features a four-wire, spi compatible inter- face that allows for a low pin-count package which occupies less board space and ultimately lowers total system costs. the SST25VF020B devices are enhanced with improved operating frequency and even lower power con- sumption. SST25VF020B spi serial flash memories are manufactured with sst proprietary, high performance cmos superflash technology. the split- gate cell design and thick-oxide tunneling injector attain better reliability and manufacturability compared with alternate approaches.
?2011 silicon storage technology, inc. s71417-03-000 02/11 2 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company product description the 25 series serial flash family features a four-wire, spi-compatible interface that allows for a low pin-count package which occupies less board space and ultimately lowers total system costs. the SST25VF020B devices are enhanced with improved operating frequency and even lower power con- sumption. SST25VF020B spi serial flash memories are manufactured with sst proprietary, high-per- formance cmos superflash technology. the split-gate cell design and thick-oxide tunneling injector attain better reliability and manufacturability compared with alternate approaches. the SST25VF020B devices significantly improve performance and reliability, while lowering power consumption. the devices write (program or erase) with a single power supply of 2.7-3.6v for SST25VF020B. the total energy consumed is a function of the applied voltage, current, and time of application. since for any given voltage range, the superflash technology uses less current to pro- gram and has a shorter erase time, the total energy consumed during any erase or program operation is less than alternative flash memory technologies. the SST25VF020B device is offered in 8-lead soic (150 mils) and 8-contact wson (6mm x 5mm) packages. see figure 2 for pin assignments.
?2011 silicon storage technology, inc. s71417-03-000 02/11 3 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company functional block diagram figure 1: functional block diagram 1417 b1.0 i/o buffers and data latches superflash memory x - decoder control logic address buffers and latches ce# y - decoder sck si so wp# hold# serial interface
?2011 silicon storage technology, inc. s71417-03-000 02/11 4 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company pin description figure 2: pin assignments table 1: pin description symbol pin name functions sck serial clock to provide the timing of the serial interface. commands, addresses, or input data are latched on the rising edge of the clock input, while output data is shifted out on the falling edge of the clock input. si serial data input to transfer commands, addresses, or data serially into the device. inputs are latched on the rising edge of the serial clock. so serial data output to transfer data serially out of the device. data is shifted out on the falling edge of the serial clock. outputs flash busy status during aai programming when reconfigured as ry/ by# pin. see ?hardware end-of-write detection? on page 14 for details. ce# chip enable the device is enabled by a high to low transition on ce#. ce# must remain low for the duration of any command sequence. wp# write protect the write protect (wp#) pin is used to enable/disable bpl bit in the status reg- ister. hold# hold to temporarily stop serial communication with spi flash memory without reset- ting the device. v dd power supply to provide power supply voltage: 2.7-3.6v for SST25VF020B v ss ground t1.0 1417 1 2 3 4 8 7 6 5 ce# so wp# v ss v dd hold# sck si top view 1417 08-soic s2a p1.0 8-lead soic 1 2 3 4 8 7 6 5 ce# so wp# v ss top view v dd hold# sck si 1417 08-wson qa p2.0 8-contact wson
?2011 silicon storage technology, inc. s71417-03-000 02/11 5 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company memory organization the SST25VF020B superflash memory array is organized in uniform 4 kbyte erasable sectors with 32 kbyte overlay blocks and 64 kbyte overlay erasable blocks. device operation the SST25VF020B is accessed through the spi (serial peripheral interface) bus compatible protocol. the spi bus consist of four control lines; chip enable (ce#) is used to select the device, and data is accessed through the serial data input (si), serial data output (so), and serial clock (sck). the SST25VF020B supports both mode 0 (0,0) and mode 3 (1,1) of spi bus operations. the difference between the two modes, as shown in figure 3, is the state of the sck signal when the bus master is in stand-by mode and no data is being transferred. the sck signal is low for mode 0 and sck signal is high for mode 3. for both modes, the serial data in (si) is sampled at the rising edge of the sck clock signal and the serial data output (so) is driven after the falling edge of the sck clock signal. figure 3: spi protocol 1417 spiprot.0 mode 3 sck si so ce# mode 3 don't care bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0 bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0 mode 0 mode 0 high impedance msb msb
?2011 silicon storage technology, inc. s71417-03-000 02/11 6 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company hold operation the hold# pin is used to pause a serial sequence underway with the spi flash memory without reset- ting the clocking sequence. to activate the hold# mode, ce# must be in active low state. the hold# mode begins when the sck active low state coincides with the falling edge of the hold# signal. the hold mode ends when the hold# signal?s rising edge coincides with the sck active low state. if the falling edge of the hold# signal does not coincide with the sck active low state, then the device enters hold mode when the sck next reaches the active low state. similarly, if the rising edge of the hold# signal does not coincide with the sck active low state, then the device exits in hold mode when the sck next reaches the active low state. see figure 4 for hold condition waveform. once the device enters hold mode, so will be in high-impedance state while si and sck can be v il or v ih. if ce# is driven high during a hold condition, the device returns to standby mode. as long as hold# signal is low, the memory remains in the hold condition. to resume communication with the device, hold# must be driven active high, and ce# must be driven active low. see figure 4 for hold timing. figure 4: hold condition waveform write protection SST25VF020B pro vides software write protection. the write protect pin (wp#) enables or disables the lock-down function of the status register. the block-protection bits (bp1, bp0, and bpl) in the sta- tus register, and the top/bottom sector protection status bits (tsp and bsp) in status register 1, pro- vide write protection to the memory array and the status register. see table 5 for the block-protection description. write protect pin (wp#) the write protect (wp#) pin enables the lock-down function of the bpl bit (bit 7) in the status register. when wp# is driven low, the execution of the write-status-register (wrsr) instruction is determined by the value of the bpl bit (see table 2). when wp# is high, the lock-down function of the bpl bit is disabled. table 2: conditions to execute write-status-register (wrsr) instruction wp# bpl execute wrsr instruction l 1 not allowed l 0 allowed h x allowed t2.0 1417 active hold active hold active 1417 holdcond.0 sck hold#
?2011 silicon storage technology, inc. s71417-03-000 02/11 7 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company status register the software status register provides status on whether the flash memory array is available for any read or write operation, whether the device is write enabled, and the state of the memory write pro- tection. during an internal erase or program operation, the status register may be read only to deter- mine the completion of an operation in progress. table 3 describes the function of each bit in the software status register. software status register 1 the software status register 1 is an additional register that contains top sector and bottom sector protection bits. these register bits are read/writable and determine the lock and unlock status of the top and bottom sectors. table 4 describes the function of each bit in the software status register 1. table 3: software status register bit name function default at power-up read/write 0 busy 1 = internal write operation is in progress 0 = no internal write operation is in progress 0r 1 wel 1 = device is memory write enabled 0 = device is not memory write enabled 0r 2 bp0 indicates current level of block write protection (see table 5) 1 r/w 3 bp1 indicates current level of block write protection (see table 5) 1 r/w 4:5 res reserved for future use 0 n/a 6 aai auto address increment programming status 1 = aai programming mode 0 = byte-program mode 0r 7 bpl 1 = bp1, bp0 are read-only bits 0 = bp1, bp0 are read/writable 0 r/w t3.0 1417 table 4: software status register 1 bit name function default at power-up read/write 0:1 res reserved for future use 0 n/a 2 tsp top sector protection status 1 = indicates highest sector is write locked 0 = indicates highest sector is write accessible 0 r/w 3 bsp bottom sector protection status 1 = indicates lowest sector is write locked 0 = indicates lowest sector is write accessible 0 r/w 4:7 res reserved for future use 0 n/a t4.0 1417
?2011 silicon storage technology, inc. s71417-03-000 02/11 8 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company busy the busy bit determines whether there is an internal erase or program operation in progress. a ?1? for the busy bit indicates the device is busy with an operation in progress. a ?0? indicates the device is ready for the next valid operation. write enable latch (wel) the write-enable-latch bit indicates the status of the internal memory write enable latch. if the write-enable-latch bit is set to ?1?, it indicates the device is write enabled. if the bit is set to ?0? (reset), it indicates the device is not write enabled and does not accept any memory write (program/erase) commands. the write-enable-latch bit is automatically reset under the following conditions: ? power-up ? write-disable (wrdi) instruction completion ? byte-program instruction completion ? auto address increment (aai) programming is completed or reached its highest unpro- tected memory address ? sector-erase instruction completion ? block-erase instruction completion ? chip-erase instruction completion ? write-status-register instructions auto address increment (aai) the auto address increment programming-status bit provides status on whether the device is in aai programming mode or byte-program mode. the default at power up is byte-program mode. block protection (bp1, bp0) the block-protection (bp1, bp0) bits define the size of the memory area, as defined in table 5, to be software protected against any memory write (program or erase) operation. the write-status-regis- ter (wrsr) instruction is used to program the bp1 and bp0 bits as long as wp# is high or the block- protect-lock (bpl) bit is 0. chip-erase can only be executed if block-protection bits are all 0. after power-up, bp1 and bp0 are set to 1. block protection lock-down (bpl) wp# pin driven low (v il ), enables the block-protection-lock-down (bpl) bit. when bpl is set to 1, it prevents any further alteration of the bpl, bp1, and bp0 bits of the status register and bsp and tsp of status register 1. when the wp# pin is driven high (vih), the bpl bit has no effect and its value is ?don?t care?. after power-up, the bpl bit is reset to 0. table 5: software status register block protection for SST25VF020B 1 1. x = don?t care (reserved) default is ?0 protection level status register bit 2 2. default at power-up for bp1 and bp0 is ?11?. (all blocks protected) protected memory address bp1 bp0 2 mbit 0 0 0 none 1 (1/4 memory array) 0 1 030000h-03ffffh 1 (1/2 memory array) 1 0 020000h-03ffffh 1 (full memory array) 1 1 000000h-03ffffh t5.0 1417
?2011 silicon storage technology, inc. s71417-03-000 02/11 9 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company top-sector protection/bottom-sector protection the top-sector protection (tsp) and bottom-sector protection (bsp) bits independently indicate whether the highest and lowest sector locations are write locked or write accessible. when tsp or bsp is set to ?1?, the respective sector is write locked; when set to ?0? the respective sector is write accessible. if tsp or bsp is set to '1' and if the top or bottom sector is within the boundary of the target address range of the program or erase instruction, the initiated instruction (byte-program, aai-word program, sector-erase, block-erase, and chip-erase) will not be executed. upon power-up, the tsp and bsp bits are automatically reset to ?0?.
?2011 silicon storage technology, inc. s71417-03-000 02/11 10 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company instructions instructions are used to read, write (erase and program), and configure the SST25VF020B. the instruction bus cycles are 8 bits each for commands (op code), data, and addresses. prior to execut- ing any byte-program, auto address increment (aai) programming, sector-erase, block-erase, write- status-register, or chip-erase instructions, the write-enable (wren) instruction must be executed first. the complete list of instructions is provided in table 6. all instructions are synchronized off a high to low transition of ce#. inputs will be accepted on the rising edge of sck starting with the most signif- icant bit. ce# must be driven low before an instruction is entered and must be driven high after the last bit of the instruction has been shifted in (except for read, read-id, and read-status-register instruc- tions). any low to high transition on ce#, before receiving the last bit of an instruction bus cycle, will terminate the instruction in progress and return the device to standby mode. instruction commands (op code), addresses, and data are all input from the most significant bit (msb) first. table 6: device operation instructions instruction description op code cycle 1 1. one bus cycle is eight clock periods. address cycle(s) 2 2. address bits above the most significant bit of each density can be v il or v ih . dummy cycle(s) data cycle(s) read read memory 0000 0011b (03h) 3 0 1 to high-speed read read memory at higher speed 0000 1011b (0bh) 3 1 1 to 4 kbyte sector-erase 3 3. 4kbyte sector erase addresses: use a ms -a 12, remaining addresses are don?t care but must be set either at v il or v ih. erase 4 kbyte of memory array 0010 0000b (20h) 3 0 0 32 kbyte block-erase 4 4. 32kbyte block erase addresses: use a ms -a 15, remaining addresses are don?t care but must be set either at v il or v ih. erase 32 kbyte block of memory array 0101 0010b (52h) 3 0 0 64 kbyte block-erase 5 5. 64kbyte block erase addresses: use a ms -a 16, remaining addresses are don?t care but must be set either at v il or v ih. erase 64 kbyte block of memory array 1101 1000b (d8h) 3 0 0 chip-erase erase full memory array 0110 0000b (60h) or 1100 0111b (c7h) 000 byte-program to program one data byte 0000 0010b (02h) 3 0 1 aai-word-program 6 6. to continue programming to the next sequential address location, enter the 8-bit command, adh, followed by 2 bytes of data to be programmed. data byte 0 will be programmed into the initial address [a 23 -a 1 ] with a 0 =0, data byte 1 will be programmed into the initial address [a 23 -a 1 ] with a 0 =1. auto address increment programming 1010 1101b (adh) 3 0 2 to rdsr 7 7. the read-status-register is continuous with ongoing clock cycles until terminated by a low to high transition on ce#. read-status-register 0000 0101b (05h) 0 0 1 to rdsr1 read-status-register 1 0011 0101b (35h) 0 0 1 to ewsr enable-write-status-register 0101b 0000b (50h) 0 0 0 wrsr write-status-register 0000 0001b (01h) 0 0 1 or 2 wren write-enable 0000 0110b (06h) 0 0 0 wrdi write-disable 0000 0100b (04h) 0 0 0 rdid 8 8. manufacturer?s id is read with a 0 =0, and device id is read with a 0 =1. all other address bits are 00h. the manufac- turer?s id and device id output stream is continuous until terminated by a low-to-high transition on ce#. read-id 1001 0000b (90h) or 1010 1011b (abh) 301to jedec-id jedec id read 1001 1111b (9fh) 0 0 3 to ebsy enable so to output ry/by# status during aai programming 0111 0000b (70h) 0 0 0 dbsy disable so as ry/by# status during aai programming 1000 0000b (80h) 0 0 0 t6.0 1417
?2011 silicon storage technology, inc. s71417-03-000 02/11 11 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company read (33 mhz) the read instruction, 03h, supports up to 33 mhz read. the device outputs the data starting from the specified address location. the data output stream is continuous through all addresses until termi- nated by a low to high transition on ce#. the internal address pointer will automatically increment until the highest memory address is reached. once the highest memory address is reached, the address pointer will automatically increment to the beginning (wrap-around) of the address space. once the data from address location 3ffffh has been read, the next output will be from address location 000000h. the read instruction is initiated by executing an 8-bit command, 03h, followed by address bits [a 23 - a 0 ]. ce# must remain active low for the duration of the read cycle. see figure 5 for the read sequence. figure 5: read sequence 1417 readseq.0 ce# so si sck add. 012345678 add. add. 03 high impedance 15 16 23 24 31 32 39 40 70 47 48 55 56 63 64 n+2 n+3 n+4 n n+1 d out msb msb msb mode 0 mode 3 d out d out d out d out
?2011 silicon storage technology, inc. s71417-03-000 02/11 12 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company high-speed-read (80 mhz) the high-speed-read instruction supporting up to 80 mhz read is initiated by executing an 8-bit com- mand, 0bh, followed by address bits [a 23 -a 0 ] and a dummy byte. ce# must remain active low for the duration of the high-speed-read cycle. see figure 6 for the high-speed-read sequence. following a dummy cycle, the high-speed-read instruction outputs the data starting from the speci- fied address location. the data output stream is continuous through all addresses until terminated by a low to high transition on ce#. the internal address pointer will automatically increment until the high- est memory address is reached. once the highest memory address is reached, the address pointer will automatically increment to the beginning (wrap-around) of the address space. once the data from address location 3fffh has been read, the next output will be from address location 00000h. figure 6: high-speed-read sequence 1417 hsrdseq.0 ce# so si sck add. 012345678 add. add. 0b high impedance 15 16 23 24 31 32 39 40 47 48 55 56 63 64 n+2 n+3 n+4 n n+1 x msb msb msb mode 0 mode 3 d out d out d out d out 80 71 72 d out note: x = dummy byte: 8 clocks input dummy cycle (v il or v ih )
?2011 silicon storage technology, inc. s71417-03-000 02/11 13 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company byte-program the byte-program instruction programs the bits in the selected byte to the desired data. the selected byte must be in the erased state (ffh) when initiating a program operation. a byte-program instruction applied to a protected memory area will be ignored. prior to any write operation, the write-enable (wren) instruction must be executed. ce# must remain active low for the duration of the byte-program instruction. the byte-program instruction is initiated by executing an 8-bit command, 02h, followed by address bits [a 23 -a 0 ]. following the address, the data is input in order from msb (bit 7) to lsb (bit 0). ce# must be driven high before the instruction is exe- cuted. the user may poll the busy bit in the software status register or wait t bp for the completion of the internal self-timed byte-program operation. see figure 7 for the byte-program sequence. figure 7: byte-program sequence 1417 byteprog.0 ce# so si sck add. 012345678 add. add. d in 02 high impedance 15 16 23 24 31 32 39 mode 0 mode 3 msb msb msb lsb
?2011 silicon storage technology, inc. s71417-03-000 02/11 14 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company auto address increment (aai) word-program the aai program instruction allows multiple bytes of data to be programmed without re-issuing the next sequential address location. this feature decreases total programming time when multiple bytes or entire memory array is to be programmed. an aai word program instruction pointing to a protected memory area will be ignored. the selected address range must be in the erased state (ffh) when ini- tiating an aai word program operation. while within aai word programming sequence, only the fol- lowing instructions are valid: for software end-of-write detection?aai word (adh), wrdi (04h), and rdsr (05h); for hardware end-of-write detection?aai word (adh) and wrdi (04h). there are three options to determine the completion of each aai word program cycle: hardware detection by reading the serial output, software detection by polling the busy bit in the software status register, or wait t bp. refer to?end-of-write detection? for details. prior to any write operation, the write-enable (wren) instruction must be executed. initiate the aai word program instruction by executing an 8-bit command, adh, followed by address bits [a 23 -a 0 ]. fol- lowing the addresses, two bytes of data are input sequentially, each one from msb (bit 7) to lsb (bit 0). the first byte of data (d0) is programmed into the initial address [a 23 -a 1 ] with a 0 =0, the second byte of data (d1) is programmed into the initial address [a 23 -a 1 ] with a 0 =1. ce# must be driven high before executing the aai word program instruction. check the busy status before entering the next valid command. once the device indicates it is no longer busy, data for the next two sequential addresses may be programmed, followed by the next two, and so on. when programming the last desired word, or the highest unprotected memory address, check the busy status using either the hardware or software (rdsr instruction) method to check for program comple- tion. once programming is complete, use the applicable method to terminate aai. if the device is in software end-of-write detection mode, execute the write-disable (wrdi) instruction, 04h. if the device is in aai hardware end-of-write detection mode, execute the write-disable (wrdi) instruction, 04h, followed by the 8-bit dbsy command, 80h. there is no wrap mode during aai programming once the highest unprotected memory address is reached. see figures 10 and 11 for the aai word programming sequence. end-of-write detection there are three methods to determine completion of a program cycle during aai word programming: hardware detection by reading the serial output, software detection by polling the busy bit in the soft- ware status register, or wait t bp. the hardware end-of-write detection method is described in the section below. hardware end-of-write detection the hardware end-of-write detection method eliminates the overhead of polling the busy bit in the software status register during an aai word program operation. the 8-bit command, 70h, configures the serial output (so) pin to indicate flash busy status during aai word programming. (see figure 8) the 8-bit command, 70h, must be executed prior to initiating an aai word-program instruction. once an internal programming operation begins, asserting ce# will immediately drive the status of the inter- nal flash status on the so pin. a ?0? indicates the device is busy and a ?1? indicates the device is ready for the next instruction. de-asserting ce# will return the so pin to tri-state. while in aai and hardware end-of-write detection mode, the only valid instructions are aai word (adh) and wrdi (04h). to exit aai hardware end-of-write detection, first execute wrdi instruction, 04h, to reset the write- enable-latch bit (wel=0) and aai bit. then execute the 8-bit dbsy command, 80h, to disable ry/ by# status during the aai command. see figures 9 and 10.
?2011 silicon storage technology, inc. s71417-03-000 02/11 15 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company figure 8: enable so as hardware ry/by# during aai programming figure 9: disable so as hardware ry/by# during aai programming ce# so si sck 01234567 70 high impedance mode 0 mode 3 1271 enableso.0 msb ce# so si sck 01234567 80 high impedance mode 0 mode 3 1271 disableso.0 msb
?2011 silicon storage technology, inc. s71417-03-000 02/11 16 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company figure 10: auto address increment (aai) word-program sequence with hardware end-of-write detection figure 11: auto address increment (aai) word-program sequence with software end-of-write detection ce# si sck so check for flash busy status to load next valid 1 command load aai command, address, 2 bytes data note: 1. valid commands during aai programming: aai command or wrdi command 2. user must configure the so pin to output flash busy status during aai programming 0 aaa ad d0 ad mode 3 mode 0 d1 d2 d3 7 wren ebsy 0 7 078 32 47 15 16 23 24 31 0 40 39 7 8 15 16 23 d out wrdi followed by dbsy to exit aai mode wrdi rdsr 7015 7 8 0 dbsy 7 0 ce# cont. si cont. sck cont. so cont. last 2 data bytes ad d n-1 d n 7 8 15 16 23 0 check for flash busy status to load next valid 1 command 078 32 47 15 16 23 24 31 0 40 39 7 8 15 16 23 7 8 15 16 23 70 15 78 00 ce# si sck so d out mode 3 mode 0 1417 aai.sw.2 note: 1. valid commands during aai programming: aai command, rdsr command, or wrdi command wait t bp or poll software status register to load next valid 1 command last 2 data bytes wrdi to exit aai mode load aai command, address, 2 bytes data aaa ad d0 ad d1 d2 d3 ad d n-1 d n wrdi rdsr
?2011 silicon storage technology, inc. s71417-03-000 02/11 17 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company 4-kbyte sector-erase the sector-erase instruction clears all bits in the selected 4 kbyte sector to ffh. a sector-erase instruction applied to a protected memory area will be ignored. prior to any write operation, the write- enable (wren) instruction must be executed. ce# must remain active low for the duration of any com- mand sequence. the sector-erase instruction is initiated by executing an 8-bit command, 20h, fol- lowed by address bits [a 23 -a 0 ]. address bits [a ms -a 12 ](a ms = most significant address) are used to determine the sector address (sa x ), remaining address bits can be v il or v ih. ce# must be driven high before the instruction is executed. the user may poll the busy bit in the software status register or wait t se for the completion of the internal self-timed sector-erase cycle. see figure 12 for the sector- erase sequence. figure 12: sector-erase sequence ce# so si sck add. 012345678 add. add. 20 high impedance 15 16 23 24 31 mode 0 mode 3 1417 secerase.0 msb msb
?2011 silicon storage technology, inc. s71417-03-000 02/11 18 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company 32-kbyte and 64-kbyte block-erase the 32-kbyte block-erase instruction clears all bits in the selected 32 kbyte block to ffh. a block- erase instruction applied to a protected memory area will be ignored. the 64-kbyte block-erase instruc- tion clears all bits in the selected 64 kbyte block to ffh. a block-erase instruction applied to a protected mem- ory area will be ignored. prior to any write operation, the write-enable (wren) instruction must be executed. ce# must remain active low for the duration of any command sequence. the 32-kbyte block-erase instruction is initiated by executing an 8-bit command, 52h, followed by address bits [a 23 -a 0 ]. address bits [a ms -a 15 ](a ms = most significant address) are used to determine block address (ba x ), remaining address bits can be v il or v ih. ce# must be driven high before the instruction is executed. the 64-kbyte block- erase instruction is initiated by executing an 8-bit command d8h, followed by address bits [a 23 -a 0 ]. address bits [a ms -a 15 ] are used to determine block address (ba x ), remaining address bits can be v il or v ih. ce# must be driven high before the instruction is executed. the user may poll the busy bit in the software status register or wait t be for the completion of the internal self-timed 32-kbyte block-erase or 64-kbyte block-erase cycles. see figures 13 and 14 for the 32-kbyte block-erase and 64-kbyte block-erase sequences. figure 13: 32-kbyte block-erase sequence figure 14: 64-kbyte block-erase sequence ce# so si sck addr 012345678 addr addr 52 high impedance 15 16 23 24 31 mode 0 mode 3 1417 32kbkler.0 msb msb ce# so si sck addr 012345678 addr addr d8 high impedance 15 16 23 24 31 mode 0 mode 3 1417 63kblker.0 msb msb
?2011 silicon storage technology, inc. s71417-03-000 02/11 19 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company chip-erase the chip-erase instruction clears all bits in the device to ffh. a chip-erase instruction will be ignored if any of the memory area is protected. prior to any write operation, the write-enable (wren) instruction must be executed. ce# must remain active low for the duration of the chip-erase instruction sequence. the chip-erase instruction is initiated by executing an 8-bit command, 60h or c7h. ce# must be driven high before the instruction is executed. the user may poll the busy bit in the software status register or wait t ce for the completion of the internal self-timed chip-erase cycle. see figure 15 for the chip-erase sequence. figure 15: chip-erase sequence read-status-register (rdsr) the read-status-register (rdsr) instruction allows reading of the status register. the status regis- ter may be read at any time even during a write (program/erase) operation. when a write operation is in progress, the busy bit may be checked before sending any new commands to assure that the new commands are properly received by the device. ce# must be driven low before the rdsr instruction is entered and remain low until the status data is read. read-status-register is continuous with ongoing clock cycles until it is terminated by a low to high transition of the ce#. see figure 16 for the rdsr instruction sequence. figure 16: read-status-register (rdsr) sequence ce# so si sck 01234567 60 or c7 high impedance mode 0 mode 3 1417 cher.0 msb 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 1417 rdsrseq.0 mode 3 sck si so ce# bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0 05 mode 0 high impedance status register out msb msb
?2011 silicon storage technology, inc. s71417-03-000 02/11 20 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company read-status-register (rdsr1) the read-status-register 1 (rdsr1) instruction allows reading of the status register 1. ce# must be driven low before the rdsr instruction is entered and remain low until the status data is read. read- status-register 1 is continuous with ongoing clock cycles until it is terminated by a low to high transi- tion of the ce#. see figure 17 for the rdsr instruction sequence. figure 17: read-status-register 1 (rdsr1) sequence write-enable (wren) the write-enable (wren) instruction sets the write-enable-latch bit in the status register to 1 allow- ing write operations to occur. the wren instruction must be executed prior to any write (program/ erase) operation. the wren instruction may also be used to allow execution of the write-status-reg- ister (wrsr) instruction; however, the write-enable-latch bit in the status register will be cleared upon the rising edge ce# of the wrsr instruction. ce# must be driven high before the wren instruc- tion is executed. 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 1417 rdsr1seq.0 mode 3 sck si so ce# bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0 35 mode 0 high impedance status register out msb msb ce# so si sck 01234567 06 high impedance mode 0 mode 3 1417 wren.0 msb
?2011 silicon storage technology, inc. s71417-03-000 02/11 21 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company figure 18: write enable (wren) sequence write-disable (wrdi) the write-disable (wrdi) instruction resets the write-enable-latch bit and aai bit to 0 disabling any new write operations from occurring. the wrdi instruction will not terminate any programming opera- tion in progress. any program operation in progress may continue up to t bp after executing the wrdi instruction. ce# must be driven high before the wrdi instruction is executed. figure 19: write disable (wrdi) sequence enable-write-status-register (ewsr) the enable-write-status-register (ewsr) instruction arms the write-status-register (wrsr) instruction and opens the status register for alteration. the write-status-register instruction must be executed immediately after the execution of the enable-write-status-register instruction. this two- step instruction sequence of the ewsr instruction followed by the wrsr instruction works like sdp (software data protection) command structure which prevents any accidental alteration of the status register values. ce# must be driven low before the ewsr instruction is entered and must be driven high before the ewsr instruction is executed. ce# so si sck 01234567 04 high impedance mode 0 mode 3 1417 wrdi.0 msb
?2011 silicon storage technology, inc. s71417-03-000 02/11 22 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company write-status-register (wrsr) the write-status-register instruction writes new values to the bp1, bp0, and bpl bits of the status register. ce# must be driven low before the command sequence of the wrsr instruction is entered and driven high before the wrsr instruction is executed. see figure 20 for ewsr or wren and wrsr for byte-data input sequences. executing the write-status-register instruction will be ignored when wp# is low and bpl bit is set to ?1?. when the wp# is low, the bpl bit can only be set from ?0? to ?1? to lock-down the status register, but cannot be reset from ?1? to ?0?. when wp# is high, the lock-down function of the bpl bit is disabled and the bpl, bp0, and bp1 bits in the status register can all be changed. as long as bpl bit is set to 0 or wp# pin is driven high (v ih ) prior to the low-to-high transition of the ce# pin at the end of the wrsr instruction, the bits in the status register can all be altered by the wrsr instruction. in this case, a sin- gle wrsr instruction can set the bpl bit to ?1? to lock down the status register as well as altering the bp0, bp1, and bp2 bits at the same time. see table 2 for a summary description of wp# and bpl functions. figure 20: enable-write-status-register (ewsr) or write-enable (wren) and write-status-register (wrsr) byte-data input sequence the write-status-register instruction also writes new values to the status register 1. to write values to status register 1, the wrsr sequence needs a word-data input?the first byte being the status register bits, followed by the second byte status register 1 bits. ce# must be driven low before the command sequence of the wrsr instruction is entered and driven high before the wrsr instruction is executed. see figure 21 for ewsr or wren and wrsr instruction word-data input sequences. executing the write-status-register instruction will be ignored when wp# is low and bpl bit is set to ?1?. when the wp# is low, the bpl bit can only be set from ?0? to ?1? to lock-down the status registers, but cannot be reset from ?1? to ?0?. when wp# is high, the lock-down function of the bpl bit is disabled and the bpl, bp0, bp1, tsp, and bsp bits in the status register can all be changed. as long as bpl bit is set to 0 or wp# pin is driven high (v ih ) prior to the low-to-high transition of the ce# pin at the end of the wrsr instruction, the bits in the status register can all be altered by the wrsr instruction. in this case, a single wrsr instruction can set the bpl bit to ?1? to lock down the status register as well as altering the bpl, bp0, bp1, tsp, and bsp bits at the same time. see table 2 for a summary description of wp# and bpl functions. 1417 ewsr.0 mode 3 high impedance mode 0 status register in 76543210 msb msb msb 01 mode 3 sck si so ce# mode 0 50 or 06 0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
?2011 silicon storage technology, inc. s71417-03-000 02/11 23 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company figure 21: enable-write-status-register (ewsr) or write-enable (wren) and write-status-register (wrsr) word-data input sequence the wrsr instruction can either execute a byte-data or a word-data input. extra data/clock input, or within byte-/word-data input, will not be executed. the reason for the byte support is for backward com- patibility to products where wrsr instruction sequence is followed by only a byte-data. jedec read-id the jedec read-id instruction identifies the device as SST25VF020B and the manufacturer as sst. the device information can be read from executing the 8-bit command, 9fh. following the jedec read-id instruction, the 8-bit manufacturer?s id, bfh, is output from the device. after that, a 16-bit device id is shifted out on the so pin. byte 1, bfh, identifies the manufacturer as sst. byte 2, 25h, identifies the memory type as spi serial flash. byte 3, 8ch, identifies the device as SST25VF020B. the instruction sequence is shown in figure 22. the jedec read id instruction is terminated by a low to high transition on ce# at any time during data output. figure 22: jedec read-id sequence table 7: jedec read-id data device id manufacturer?s id memory type memory capacity byte1 byte 2 byte 3 bfh 25h 8ch t7.0 1417 1417 ewsr1.0 mode 3 high impedance mode 0 status register 76543210 msb msb msb 01 mode 3 sck si so ce# mode 0 50 or 06 0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 status register 1 76543210 msb 16 17 18 19 20 21 22 23 25 8c 1417 jedecid. 1 ce# so si sck 012345678 high impedance 15 16 14 28 29 30 31 bf mode 3 mode 0 msb msb 9 10111213 1718 9f 19 20 21 22 23 24 25 26 27
?2011 silicon storage technology, inc. s71417-03-000 02/11 24 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company read-id (rdid) the read-id instruction (rdid) identifies the devices as SST25VF020B and manuf acturer as sst. the device information can be read from executing an 8-bit command, 90h or abh, followed by address bits [a 23 -a 0 ]. following the read-id instruction, the manufacturer?s id is located in address 00000h and the device id is located in address 00001h. once the device is in read-id mode, the manufac- turer?s and device id output data toggles between address 00000h and 00001h until terminated by a low to high transition on ce#. refer to tables 7 and 8 for device identification data. figure 23: read-id sequence table 8: product identification address data manufacturer?s id 00000h bfh device id SST25VF020B 00001h 8ch t8.0 1417 1417 rdid.0 ce# so si sck 00 012345678 00 add 1 90 or ab high impedance 15 16 23 24 31 32 39 40 47 48 55 56 63 bf device id bf device id note: the manufacturer's and device id output stream is continuous until terminated by a low to high transition on ce#. device id = 8ch for SST25VF020B 1. 00h will output the manfacturer's id first and 01h will output device id first before toggling between the two. high impedance mode 3 mode 0 msb msb msb
?2011 silicon storage technology, inc. s71417-03-000 02/11 25 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company electrical specifications absolute maximum stress ratings (applied conditions greater than those listed under ?absolute maximum stress ratings? may cause permanent damage to the device. this is a stress rating only and functional operation of the device at these conditions or conditions greater than those defined in the operational sections of this data sheet is not implied. exposure to absolute maximum stress rating con- ditions may affect device reliability.) temperature under bias .............................................. -55c to +125c storage temperature ................................................. -65c to +150c d. c. voltage on any pin to ground potential ............................. -0.5v to v dd +0.5v transient voltage (<20 ns) on any pin to ground potential .................. -2.0v to v dd +2.0v package power dissipation capability (t a = 25c) ................................... 1.0w surface mount solder reflow temperature ........................... 260c for 10 seconds output short circuit current 1 ................................................... 50ma 1. output shorted for no more than one second. no more than one output shorted at a time. table 9: operating range range ambient temp v dd commercial 0c to +70c 2.7-3.6v industrial -40c to +85c 2.7-3.6v t9.1 1417 table 10: ac conditions of test 1 1. see figures 29 and 30 input rise/fall time output load 5ns c l =30pf t10.1 1417
?2011 silicon storage technology, inc. s71417-03-000 02/11 26 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company table 11: dc operating characteristics symbol parameter limits test conditions min max units i ddr read current 12 ma ce#=0.1 v dd /0.9 v dd @33 mhz, so=open i ddr3 read current 20 ma ce#=0.1 v dd /0.9 v dd @80 mhz, so=open i ddw program and erase current 30 ma ce#=v dd i sb standby current 20 a ce#=v dd ,v in =v dd or v ss i li input leakage current 1 a v in =gnd to v dd ,v dd =v dd max i lo output leakage current 1 a v out =gnd to v dd ,v dd =v dd max v il input low voltage 0.8 v v dd =v dd min v ih input high voltage 0.7 v dd vv dd =v dd max v ol output low voltage 0.2 v i ol =100 a, v dd =v dd min v ol2 output low voltage 0.4 v i ol =1.6 ma, v dd =v dd min v oh output high voltage v dd -0.2 v i oh =-100 a, v dd =v dd min t11.0 1417 table 12: recommended system power-up timings symbol parameter minimum units t pu-read 1 1. this parameter is measured only for initial qualification and after a design or process change that could affect this parameter. v dd min to read operation 10 s t pu-write 1 v dd min to write operation 10 s t12.0 1417 table 13: capacitance (t a = 25c, f=1 mhz, other pins open) parameter description test condition maximum c out 1 1. this parameter is measured only for initial qualification and after a design or process change that could affect this parameter. output pin capacitance v out =0v 12pf c in 1 input capacitance v in =0v 6pf t13.0 1417 table 14: reliability characteristics symbol parameter minimum specification units test method n end 1 1. this parameter is measured only for initial qualification and after a design or process change that could affect this parameter. endurance 10,000 cycles jedec standard a117 t dr 1 data retention 100 years jedec standard a103 i lth 1 latch up 100 + i dd ma jedec standard 78 t14.0 1417
?2011 silicon storage technology, inc. s71417-03-000 02/11 27 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company table 15: ac operating characteristics symbol parameter 33 mhz 80 mhz units min max min max f clk 1 serial clock frequency 33 80 mhz t sckh serial clock high time 13 6 ns t sckl serial clock low time 13 6 ns t sckr 2 serial clock rise time (slew rate) 0.1 0.1 v/ns t sckf serial clock fall time (slew rate) 0.1 0.1 v/ns t ces 3 ce# active setup time 5 5 ns t ceh 3 ce# active hold time 5 5 ns t chs 3 ce# not active setup time 5 5 ns t chh 3 ce# not active hold time 5 5 ns t cph ce# high time 50 50 ns t chz ce# high to high-z output 15 7 ns t clz sck low to low-z output 0 0 ns t ds data in setup time 2 2 ns t dh data in hold time 4 4 ns t hls hold# low setup time 5 5 ns t hhs hold# high setup time 5 5 ns t hlh hold# low hold time 5 5 ns t hhh hold# high hold time 5 5 ns t hz hold# low to high-z output 7 7 ns t lz hold# high to low-z output 7 7 ns t oh output hold from sck change 0 0 ns t v output valid from sck 10 6 ns t se sector-erase 25 25 ms t be block-erase 25 25 ms t sce chip-erase 50 50 ms t bp byte-program 10 10 s t15.0 1417 1. maximum clock frequency for read instruction, 03h, is 33 mhz 2. maximum rise and fall time may be limited by t sckh and t sckl requirements 3. relative to sck.
?2011 silicon storage technology, inc. s71417-03-000 02/11 28 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company figure 24: serial input timing diagram figure 25: serial output timing diagram figure 26: hold timing diagram high-z high-z ce# so si sck msb lsb t ds t dh t chh t ces t ceh t chs t sckr t sckf t cph 1417 serin.0 1417 serout.0 ce# si so sck msb t clz t v t sckh t chz t oh t sckl lsb t hz t lz t hhh t hls t hlh t hhs 1417 hold.0 hold# ce# sck so si
?2011 silicon storage technology, inc. s71417-03-000 02/11 29 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company power-up specifications all functionalities and dc specifications are specified for a v dd ramp rate of greater than 1v per 100 ms (0v - 3.0v in less than 300 ms). see table 16 and figure 27 for more information. figure 27: power-up timing diagram table 16: recommended system power-up timings symbol parameter minimum units t pu-read 1 1. this parameter is measured only for initial qualification and after a design or process change that could affect this parameter. v dd min to read operation 100 s t pu-write 1 v dd min to write operation 100 s t16.0 1417 time v dd min v dd max v dd device fully accessible t pu-read t pu-write chip selection is not allowed. commands may not be accepted or properly interpreted by the device. 1417 pwrup.0
?2011 silicon storage technology, inc. s71417-03-000 02/11 30 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company figure 28: recommended power-up/-down waveform table 17: recommended power-up/-down limits symbol parameter limits conditions min max units t pf v dd falling time 1 100 ms/v t pr v dd rising time 0.033 100 ms/v t off v dd off time 100 ms v off v dd off level 0.3 v 0v (recommended) t17.0 1417 1417 f28.0 t off gnd v off v dd
?2011 silicon storage technology, inc. s71417-03-000 02/11 31 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company figure 29: ac input/output reference waveforms figure 30: a test load example 1417 ioref.0 reference points output input v ht v lt v ht v lt v iht v ilt ac test inputs are driven at v iht (0.9v dd ) for a logic ?1? and v ilt (0.1v dd ) for a logic ?0?. measure- ment reference points for inputs and outputs are v ht (0.6v dd ) and v lt (0.4v dd ). input rise and fall times (10% ? 90%) are <5 ns. note: v ht -v high test v lt -v low test v iht -v input high test v ilt -v input low test 1417 tstld.0 to tester to dut c l
?2011 silicon storage technology, inc. s71417-03-000 02/11 32 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company product ordering information valid combinations for SST25VF020B note: valid combinations are those products in mass production or will be in mass production. consult your sst sales representative to confirm availability of valid combinations and to determine availability of new combinations. SST25VF020B-80-4c-qae SST25VF020B-80-4c-sae SST25VF020B-80-4i-qae SST25VF020B-80-4i-sae sst 25 vf 020b - 80 - 4c - sae xx xx xxxx - xx - xx - xxx environmental attribute e 1 = non-pb package modifier a = 8 leads or contacts package type s = soic 150 mil body width q = wson temperature range c = commercial = 0c to +70c i = industrial = -40c to +85c minimum endurance 4 = 10,000 cycles operating frequency 80 = 80 mhz device density 020 = 2 mbit voltage v = 2.7-3.6v product series 25 = serial peripheral interface flash memory 1. environmental suffix ?e? denotes non-pb solder. sst non-pb solder devices are ?rohs compliant?.
?2011 silicon storage technology, inc. s71417-03-000 02/11 33 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company packaging diagrams figure 31: 8-lead small outline integrated circuit (soic) 150mil body width (5mm x 6mm) sst package code: sa 08-soic-5x6-sa-8 note: 1. complies with jedec publication 95 ms-012 aa dimensions, although some dimensions may be more stringent. 2. all linear dimensions are in millimeters (max/min). 3. coplanarity: 0.1 mm 4. maximum allowable mold flash is 0.15 mm at the package ends and 0.25 mm between leads. top view side view end view 5.0 4.8 6.20 5.80 4.00 3.80 pin #1 identifier 0.51 0.33 1.27 bsc 0.25 0.10 1.75 1.35 7 4 places 0.25 0.19 1.27 0.40 45 7 4 places 0 8 1mm
?2011 silicon storage technology, inc. s71417-03-000 02/11 34 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company figure 32: 8-contact very-very-thin small outline no-lead (wson) sst package code: qa note: 1. all linear dimensions are in millimeters (max/min). 2. untoleranced dimensions (shown with box surround) are nominal target dimensions. 3. the external paddle is electrically connected to the die back-side and possibly to certain v ss leads. this paddle can be soldered to the pc board; it is suggested to connect this paddle to the v ss of the unit. connection of this paddle to any other voltage potential can result in shorts and/or electrical malfunction of the device. 8-wson-5x6-qa-9.0 4.0 1.27 bsc pin #1 0.48 0.35 0.076 3.4 5.00 0.10 6.00 0.10 0.05 max 0.70 0.50 0.80 0.70 0.80 0.70 pin #1 corner top view bottom view cross section side view 1mm 0.2
?2011 silicon storage technology, inc. s71417-03-000 02/11 35 2 mbit spi serial flash SST25VF020B data sheet a microchip technology company table 18: revision history number description date 00 ? initial release of data sheet dec 2009 01 ? updated table 4 on page 7 ? added figure 28 and table 17 on page 30 feb 2010 02 ? changed t ds value in table 15 on page 27 ? updated sst address on page 33 ? changed document status to ?data sheet? apr 2010 03 ? updated ?auto address increment (aai) word-program?, ?end-of- write detection?, and ?hardware end-of-write detection? on page 14. ? revised figures 10 and 11 on page page 16. ? updated document to new format. feb 2011 ? 2011 silicon storage technology, inc?a microchip technology company. all rights reserved. sst, silicon storage technology, the sst logo, superflash, mtp, and flashflex are registered trademarks of silicon storage tech- nology, inc. mpf, sqi, serial quad i/o, and z-scale are trademarks of silicon storage technology, inc. all other trademarks and registered trademarks mentioned herein are the property of their respective owners. specifications are subject to change without notice. refer to www.microchip.com or www.sst.com for the most recent documenta- tion. memory sizes denote raw storage capacity; actual usable capacity may be less. sst makes no warranty for the use of its products other than those expressly contained in the standard terms and conditions of sale. for sales office(s) location and information, please see www.microchip.com or www.sst.com. silicon storage technology, inc. a microchip technology company www.microchip.com or www.sst.com

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